A number of X-ray CT application examples of geological samples will be discussed. Examples include the analysis of cracks, pores, inclusions, and phase quantification of rocks and drill cores. We will introduce available resources for pore network analysis that can be applied to rock CT scans.
About the speaker:
Full Name: Aya Takase
Title: Senior Scientist
Organization: Rigaku Americas CorporationFor over 20 years Aya’s work has focused on the development of advanced analysis and testing methods using X-ray technologies. Aya believes user-friendly X-ray tools can greatly help materials science researchers and works with Rigaku staff and users to design automated, user-friendly CT and XRD systems. Aya is also at the forefront of Rigaku’s development of application specific customer training programs. Aya holds a MA in physics from Tokyo University of Science.
About the host:
Full Name: Tom McNulty
Title: SVP, General Manager
Organization: Rigaku Americas Corporation
Tom brings more than 40 years of analytical X-ray experience to his current position at Rigaku. Interests include X-ray Crystallography, X-ray Spectroscopy, X-ray Powder and Thin Film Diffraction, and X-ray Computed Tomography. Tom’s position as the GM of the Materials Science group includes the oversight of Rigaku’s current effort to educate scientists about the emerging role of CT in Materials Research. Tom holds an MA in Chemistry from SUNY Buffalo.