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使用台式WDXRF 通过熔融法对多种氧化 材料的广泛浓度范围进行分析

AppNote XRF1048: 使用台式WDXRF 通过熔融法对多种氧化 材料的广泛浓度范围进行分析

简介

X 射线荧光(XRF)分析中,熔融法是一个有效的样品制备技术,由于该技术根据晶粒尺寸和矿物学差异消除了不均一性,用于获得粉末样品精确的分析结果。此外,玻璃化材料属性的均匀化,通过使用熔片和试剂的合成标准物质或使用多种基准物质,使能够扩大校正范围。

此应用报告说明了使用Supermini200 ―一个台式波长色散(WD)XRF 光谱仪,通过熔融法建立例如矿物、矿石和耐熔物等不同材料的单一工作曲线。

WDXRF Products from Rigaku

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

High power, tube above, sequential WDXRF spectrometer

WDXRF spectrometer designed to handle very large and/or heavy samples

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U

WDXRF ultralow chlorine analyzer

WDXRF ultra low sulfur analyzer for method ASTM D2622

ASTM D2622 method WDXRF analyzer for sulfur (S) in petroleum fuels and ULSD

Tube below, single element WDXRF analyzer for quality control applications