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Elemental Analysis

Elemental analysis

Measure almost any element in almost any matrix

X-ray fluorescence (XRF) provides one of the simplest, most accurate and most economic analytical methods for the determination of elemental composition of many types of materials. Indispensable to both R&D and quality assurance (QA) functions, our advanced and unique WDXRF products are routinely used to analyze products from cement to plastics and from metals to food to semiconductor wafers. Rigaku offerings range from high power, high-performance wavelength dispersive WDXRF systems, for the most demanding applications, to a complete line of benchtop EDXRF and WDXRF systems.
 

 

Application notes

The following application notes are relevant to this application

WDXRF

EDXRF

Process

Total reflection XRF (TXRF)

X-ray topography (XRT)

Rigaku recommends the following systems:


WDXRF

Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software

WDXRF spectrometer designed to handle very large and/or heavy samples

High-throughput tube-above multi-channel simultaneous WDXRF spectrometer analyzes Be through U