聚酰亚胺薄膜中铜纳米粒子的粒度分布

以往分散在膜中的金属或陶瓷纳米粒子,通过横断面透射电镜(TEM)图像测量平均粒径和分布需要大量的劳动和时间。

小角X射线散射(SAXS)测定通过使用一个15mm×2mm的样品经过几十分钟的时间即可测定,无需对薄膜进行切片或预先处理。

下图显示了铜纳米粒子分散在聚酰亚胺薄膜中的样品热处理的温度以及横截面投射电镜照片。

temperatures of heat treatmenttemperatures of heat treatment






下图显示了SAXS数据(上)和通过NANO-Solver测定的分析结果(下),平均粒径测定为3.9微米和8.8微米。

SAXS data

NANO-Solver



样品由甲南大学工程科学系的 Hidemi Nawafune教授和Kensuke Akamatsu指导员提供。


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