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产品展示
Products 1
XRD
WDXRF
EDXRF
TXRF
SAXS
Products 2
Single crystal
半导体
Handheld Raman
Process control
Non-destructive testing
Products 3
X-ray CT
X 射线地形测绘
Evolved gas analysis
Stress analysis
Thermal analysis
Products 4
Detectors
Optics
真空密封装置
X-ray sources
行业
Industry 1
半导体
Battery
光伏
金属和合金
Food and Food Ingredients
Pharmaceuticals
Industry 2
水泥
聚合物、塑料和橡胶
石油和石化
化学
纳米技术
Life Science
Industry 3
化妆品
采矿和提炼
地质和矿产
环境和污染
安全和安防
取证和保护
Industry 4
Non-destructive testing (NDT)
教育
Advanced and New Materials
涂料和薄膜
材料科学
应用
Applications 1
化学成分
晶体取向
元素分析
危险化学品威胁
手持式拉曼光谱仪
体内应用
Applications 2
显微断层摄影术(X 射线 CT)
微衍射
Molecular imaging
麻醉剂/毒品
粒径和形状
PDF analysis
Applications 3
聚合物和纤维
同质多形体
孔径分布
粉末晶体学
蛋白质晶体学
定性分析
Applications 4
定量分析
原料鉴定
残余应力分析
Rietveld 分析
SAXS
半导体计量
Application 5
单晶 X 射线衍射
光谱学
硫分析
织构和极图
薄膜分析
X 射线反射 (XRR)
支持
Support 1
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即将进行的网络研讨会
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SmartLab
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Product line
Multipurpose
SAXS
XRD
Industries
Academic research
(3)
Materials science
(3)
Nanotechnology
(3)
Advanced and new materials
(2)
Chemistry
(2)
Geology & minerals
(2)
Pharmaceuticals
(2)
Battery
(1)
Cement
(1)
Coatings
(1)
Cosmetics
(1)
Environmental
(1)
Petroleum & petrochemicals
(1)
Photovoltaic manufacturing
(1)
Polymers, plastics & rubber
(1)
Semiconductor manufacturing
(1)
Analytical techniques
X-ray fluorescence (XRF)
Protein crystallography
Single crystal X-ray diffraction
Chemical crystallography
Non-destructive testing
Thermal analysis
SAXS
X-ray diffraction (XRD)
Handheld Raman
Residual stress analysis
Total reflection X-ray fluorescence (TXRF)
Computed tomography
High-temperature XRD
Powder crystallography
Rietveld analysis
High-resolution XRD
Low-temperature diffraction
Microdiffraction
Microtomography
SAXS (biological)
SAXS (industrial)
SAXS (polymers and gels)
X-ray reflectometry (XRR)
XRD-DSC
Direct X-ray detection
Evolved gas analysis
Powder diffraction
Process control
X-ray topography
X-ray transmission (XRT)
(-)
In-plane diffraction
Applications
Composition identification
Qualitative analysis
Quantitative analysis
SAXS (industrial)
Thin film analysis
Crystal orientation
High-resolution XRD
High-temperature XRD
Low-temperature diffraction
Pore size distribution
Powder crystallography
Residual stress analysis
Rietveld analysis
SAXS (polymers and gels)
Texture and pole figures
Batteries
In-plane diffraction
Microdiffraction
Particle size and shape
Polymers and fibers
Polymorphs
Semiconductor metrology
X-ray reflectometry
XRD-DSC