X-ray fluorescence (XRF) spectrometry is one instrumental analysis method used to determine the composition of solid and liquid samples. Compared to other methods, it can achieve high-precision analysis. XRF is widely used for quality control in manufacturing. It is an effective method for trouble analysis during production and research and development of materials and products.
Rigaku’s ZSX Primus series of sequential wavelength dispersive X-ray fluorescence spectrometers includes tube-above high-end ZSX Primus IV, basic ZSX Primus III+ , and high-end tube-below ZSX Primus. The different instruments in this series are optimal for coping with a variety of analysis purposes. There are noteworthy advantages to both tube-above and tube-below optics.
The ZSX Primus IVi, a successor to the tube-below ZSX Primus, is newly developed based on the latest technology cultivated in the ZSX Primus IV.