Introduction
X-ray fluorescence analysis is an elemental analysismethod that can quickly and nondestructively analyze elements contained in a sample with simple sample preparation. Furthermore, it is widely used for process control and quality control analysis of steel, cement, refractories, and other materials owing to its excellent measurement reproducibility.
To meet the requirements of our customers, Rigaku’s ZSX Primus series of sequential wavelength dispersive X-ray fluorescence spectrometers include the high-end tube-above ZSX Primus IV, high-end tube-below ZSX Primus IVi and ZSX Primus400 for XRF analysis of large samples.
Rigaku has developed a new spectrometer, ZSX Primus III NEXT equipped with tube above optics, as a successor to the ZSX Primus III+ . The spectrometer has improved hardware and software performance and functions and an ability for enhanced support for daily analysis compared to the previous model.