— Analysis of extraterrestrial material by WDXRF and TG-MS —
Abstract
Spacecraft HAYABUSA2 successfully collected a 5.4 g sample from the surface of asteroid Ryugu that was returned to Earth on Dec. 6, 2020. Analysis of the asteroid Ryugu sample was performed using a ZSX Primus IV wavelength dispersive X-ray...
Rigaku launched a high-speed X-ray topography system with the improved throughput of 10–20 wafers/hour (3–6 min/wafer). High-speed image acquisition is achieved using an uncollimated divergent beam and the HyPix-3000HE hybrid pixel detector. This technical note explains two major features that contribute to this improvement by dramatically reducing the time...
Powder X-ray diffraction is widely used as an analytical method to evaluate various crystalline materials. This paper describes the basics and evaluation examples of the RIR (Reference Intensity Ratio) method and the Rietveld method.
In the RIR method, quantitative analysis is performed based on the integrated intensity of diffraction...
Powder X-ray diffraction (PXRD) can obtain a variety of information, not just a single piece of information. In the fifth installment of the powder X-ray diffraction basic course, quantitative analysis was described. This sixth installment describes the evaluation of crystallite sizes.
The Scherrer method is one analysis technique commonly...
The XSPA-400 ER (XSPA: X-ray Seamless* Pixel Array, ER: Energy Resolution) is a next-generation 2D semiconductor detector with a higher energy resolution than conventional models. With this higher energy resolution, the XSPA-400 ER reduces X-ray fluorescence, which can be a significant source of background intensity for powder diffraction patterns on...
