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Rigaku: Leading with Innovation X-ray Diffraction & Elemental Analysis
The Bridge
Unique SmartLab® Feature
Rigaku SmartLab
Easy switching between Johansson Kα₁ geometry and Bragg Brentano Kα₁, Kα₂ geometry
Most diffractometers that are configured for Johansson Kα₁ data collection cannot easily be switched back to a Bragg Brentano Kα₁, Kα₂ data collection, resulting in such systems often being dedicated to Kα₁ work. Rigaku has developed a unique stage for the SmartLab diffractometer that allows one to easily switch between the two geometries, thus eliminating the need to dedicate an instrument to Kα₁ work. Watch video >
PILATUS 200K
PILATUS 200K
Advancing single crystal analysis with a hybrid pixel array detector (HPAD)
Rigaku has adopted Dectris’ PILATUS 200K HPAD detector as the standard detector for single crystal diffraction systems. An HPAD detector is a direct detection device and offers significant advantages over indirect detection technologies, such as CCD or CMOS based detectors. The PILATUS 200K can be combined with a number of different goniometers and X-ray sources to create a system suitable for your research needs. Read more >
NEX OL
NEX OL
New EDXRF process
analyzer for liquid stream and fixed position web or
coil applications
To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX QC+ high resolution benchtop instrument. With this proven technology, the Rigaku NEX OL delivers rapid, non-destructive, multi-element analyses – from parts-per-million (ppm) levels to high weight percent (wt%) concentrations – for elements from aluminum (13Al) through uranium (92U). Equipped with a 50 kV X-ray tube and SDD detector – together with a standardized, optimized suite of tube filters – the Rigaku NEX OL is engineered to solve a broad range of process control applications. Read more >
Upcoming Conferences
ECM Meeting - Tour de Booth
Join Rigaku
Rigaku exhibited at the ECM meeting at the Univ. of Warwick, UK in August. Two exercise bikes were placed in the booth and participants were given the opportunity to ride in support of the Imperial Cancer Research Fund. Rigaku made a donation to the charity based on the total km ridden during the exhibition.

Rigaku will be sponsoring, attending or exhibiting at the following conferences and trade shows:

16th Heart of Europe
Bio-Crystallography Meeting

Austria
September 26 – 28

The International Conference
on Silicon Carbide and Related Materials

Miyazaki, JP
September 29 – October 4

(GCC) Gulf Coast Conference
Galveston, TX, USA
October 15 – 16

See more >
Events
SmartLab Workshop
SmartLab Workshop
A SmartLab workshop was held at ISIS in the UK, September 17-18. The meeting was well attended and the participants learned about SmartLab powder applications, thin film applications as well as new products, D/teX 250 and SmartStudio. If you are interested in having a SmartLab workshop in your area, please contact
keisuke.saito@rigaku.com.
Events
ECM Meeting - Tour de Booth
WMIC 2013 Savannah
Through the joint efforts of the “World Molecular Imaging Society – WMIS”, the “European Society for Molecular Imaging – ESMI” and the “Federation of Asian Societies for Molecular Imaging – FASMI”, the World Molecular Imaging Congress was held in Savannah this month. Rigaku’s small animal CT imaging system, distributed by Perkin Elmer was on display at the exhibition.
 

Welcome

In this issue of The Bridge we cover a wide range of topics that we hope you will find interesting. The use of Kα₁ radiation for measuring powder diffraction data to be used in ab initio structure analysis is a well-known technique and is described in an attached Rigaku Journal article. However, what is not commonly known is that Rigaku has developed diffractometer hardware that makes switching between Johansson Kα₁ data collection and Bragg Brentano Kα₁, Kα₂ data collection easy and trivial. You no longer have to devote a diffractometer solely to Johansson Kα₁ data collection because of the difficulties involved in reconfiguring and realigning your instrument.

It was with great sadness that we learned of the recent passing of a pioneering physicist in the field of diffraction and material characterization. Dr. Ting C. Huang, PhD died September 2nd at his home in Taiwan. Ting had a long and distinguished career at IBM and was well known by anyone who attended the Denver X-ray Conferences. His amazing career is documented in the attached tribute that was written by his very good friend, Dr. Victor Buhrke. Read tribute >

SmartLab   Featured Rigaku Journal Article
Multi-purpose X-ray diffractometer equipped with a Kα₁ optical system and ab initio powder crystal structure analysis software
Akimitsu Nedu, Application Laboratory, Rigaku Corporation

A multi-purpose X-ray diffractometer equipped with a high-resolution multilayer mirror, eliminating the Kα₂ component, is described. Moreover, an application of ab inito powder crystal structure analysis is demonstrated, utilizing the above-mentioned instrument. Read more >
SmartLab   Customer in the Spotlight
A combined XRD/gas absorption instrument

Prof. Susumu Kitagawa’s Lab at Kyoto Univ. has shown that structural flexibility and sorption behavior can be tuned by controlling the degree of interpenetration of 3D porous coordination polymers (PCPs). To further this research, Kitagawa’s group worked with Rigaku to develop a coincident adsorption/XRPD measurement system for their laboratory. Read more >
ZSX Primus   Featured Application Note
Analysis of Additive Elements in Polymers using a ZSX Primus Series/Application Package

This application note introduces an Application Package for quantitative analysis of additive elements in polymers. The Application Package includes calibration standards and drift correction samples required for the quantitative analysis, the step-by-step instruction manual, etc. Read more >
Bragg’s Law   Material Analysis in the News
News for September 2013

Each month we highlight material analysis stories that have been covered in the press. Read more >
OS X Mountain Lion: The Missing Manual   Scientific Book Review
OS X Mountain Lion: The Missing Manual

The author fulfills what he set out to do, which is to provide the missing manual for OS X, and frankly the chapter on Spotlight alone is worth the purchase price. Over the last three years I’ve bought a number of apps that I probably did not need because the functionality was buried in the OS, somewhere. Read more >

Recent Scientific Papers of Interest

Microstructures and mechanical properties of Al/Zn composites prepared by accumulative roll bonding and heat treatment. Liu, C.Y.; Zhang, B.; Yu, P.F.; Jing, R.; Ma, M.Z.; Liu, R.P. Materials Science & Engineering: A. Sep2013, Vol. 580, p36-40. 5p.
DOI: 10.1016/j.msea.2013.05.038.

X-ray photoelectron spectroscopy (XPS) and diffraction (XPD) study of a few layers of graphene on 6H-SiC(0001). Ferrah, D.; Penuelas, J.; Bottela, C.; Grenet, G.; Ouerghi, A. Surface Science. Sep2013, Vol. 615, p47-56. 10p. DOI: 10.1016/j.susc.2013.04.006.

Direct deconvolution approach for depth profiling of element concentrations in multi-layered materials by confocal micro-beam X-ray fluorescence spectrometry. Wrobel, Pawel; Czyzycki, Mateusz. Talanta. Sep2013, Vol. 113, p62-67. 6p. DOI: 10.1016/j.talanta.2013.03.087.

Application of Infrared and Raman Spectroscopy in Paint Trace Examination. Zięba-Palus, Janina; Trzcińska, Beata M. Journal of Forensic Sciences (Wiley-Blackwell). Sep2013, Vol. 58 Issue 5, p1359-1363. 5p. DOI: 10.1111/1556-4029.12183.

Vibrational spectroscopy of organic thin films used for solar cells. Furukawa, Yukio. AIP Conference Proceedings. Sep2013, Vol. 1554 Issue 1, p5-8. 4p. 1 Diagram, 2 Charts, 5 Graphs. DOI: 10.1063/1.4820272.

Raman spectroscopy for forensic analysis of inks in questioned documents. Braz, André; López-López, Maria; García-Ruiz, Carmen. Forensic Science International. 2013, Vol. 232 Issue 1-3, p206-212. 7p. DOI: 10.1016/j.forsciint.2013.07.017.

Structural investigation of GaInP nanowires using X-ray diffraction. Kriegner, D.; Persson, J.M.; Etzelstorfer, T.; Jacobsson, D.; Wallentin, J.; Wagner, J.B.; Deppert, K.; Borgström, M.T.; Stangl, J. Thin Solid Films. Sep2013, Vol. 543, p100-105. 6p. DOI: 10.1016/j.tsf.2013.02.112.

Application and analysis of a DSC-Raman spectroscopy for indium and poly(lactic acid). Suzuki, T.; Takahashi, K.; Uehara, H.; Yamanobe, T. Journal of Thermal Analysis & Calorimetry. Sep2013, Vol. 113 Issue 3, p1543-1549. 7p. DOI: 10.1007/s10973-013-3098-z.

Performances for confocal X-ray diffraction technology based on polycapillary slightly focusing X-ray optics. Liu, Hehe; Liu, Zhiguo; Sun, Tianxi; Peng, Song; Ma, Yongzhong; Sun, Weiyuan; Li, Yude; Lin, Xiaoyan; Zhao, Weigang; Zhao, Guangcui; Luo, Ping; Pan, Qiuli; Ding, Xunliang. Nuclear Instruments & Methods in Physics Research Section A. Sep2013, Vol. 723, p1-4. 4p. DOI: 10.1016/j.nima.2013.05.002.

2D SAXS/WAXD analysis of pan carbon fiber microstructure in organic/inorganic transformation. Zhu, Cai-zhen; Yu, Xiao-lan; Liu, Xiao-fang; Mao, Yun-zen; Liu, Rui-gang; 赵宁 Zhao, Ning; Zhang, Xiao-li; 徐坚 Xu, Jian. Chinese Journal of Polymer Science (Springer Science & Business Media B.V.). Sep2013, Vol. 31 Issue 5, p823-832. 10p.
DOI: 10.1007/s10118-013-1272-1.

Stimulated X-ray emission for materials science. Beye, M.; Schreck, S.; Sorgenfrei, F.; Trabant, C.; Pontius, N.; Schüßler-Langeheine, C.; Wurth, W.; Föhlisch, A. Nature. 9/12/2013, Vol. 501 Issue 7466, p191-194. 4p. 1 Color Photograph, 2 Graphs. DOI: 10.1038/nature12449.

Mosaic-like micropillar array for hard x-ray focusing—one-dimensional version. Nazmov, Vladimir; Mohr, Juergen; Simon, Rolf. Journal of Micromechanics & Microengineering. 2013, Vol. 23 Issue 9, p1-8. 8p. DOI: 10.1088/0960-1317/23/9/095015.

X-ray diffraction study of microstructural changes during fatigue damage initiation in pipe steels: Role of the initial dislocation structure. Pinheiro, B.; Lesage, J.; Pasqualino, I.; Bemporad, E.; Benseddiq, N. Materials Science & Engineering: A. Sep2013, Vol. 580, p1-12. 12p. DOI: 10.1016/j.msea.2013.05.042.

Silver coins analyses by X-ray fluorescence methods. Torrisi, L.; Italiano, A.; Cutroneo, M.; Gentile, C.; Torrisi, A. Journal of X-Ray Science and Technology. 2013, Vol. 21 Issue 3, p381-390. 10p. 1 Color Photograph, 1 Diagram, 2 Charts, 3 Graphs. DOI: 10.3233/XST-130389.

Effect of AC electric fields on the aerosol assisted chemical vapour deposition growth of titanium dioxide thin films. Romero, Luz; Binions, Russell. Surface & Coatings Technology. Sep2013, Vol. 230, p196-201. 6p. DOI: 10.1016/j.surfcoat.2013.05.026.

Mechanical behavior of electrospun Nylon66 fibers reinforced with pristine and treated
multi-walled carbon nanotube fillers.
Jeon, Kyung Soo; Nirmala, R.; Navamathavan, R.; Kim, Hak Yong. Ceramics International. Sep2013, Vol. 39 Issue 7, p8199-8206. 8p.
DOI: 10.1016/j.ceramint.2013.04.003.

X-ray spectroscopic methods in the studies of nonstoichiometric TiO2-x thin films. Kollbek, K.; Sikora, M.; Kapusta, Cz.; Szlachetko, J.; Zakrzewska, K.; Kowalski, K.; Radecka, M. Applied Surface Science. Sep2013, Vol. 281, p100-104. 5p. DOI: 10.1016/j.apsusc.2013.02.119.

Investigation of activated oxygen molecules on the surface of Y2O3 nanocrystals by Raman scattering. Xu, J. Q.; Xiong, S. J.; Wu, X. L.; Li, T. H.; Shen, J. C.; Chu, Paul K. Journal of Applied Physics. Sep2013, Vol. 114 Issue 9, p093512-093512-5. 1p. 1 Black and White Photograph, 4 Graphs. DOI: 10.1063/1.4820465.

Growth, HR-XRD, optical, thermal, luminescence and nonlinear optical studies of novel organic nonlinear optical crystal: l-Threonine formate. Redrothu, Hanumantharao; Kalainathan, S.; Bhagavannarayana, G. Optik - International Journal for Light and Electron Optics. Sep2013, Vol. 124 Issue 18, p3718-3722. 5p. DOI: 10.1016/j.ijleo.2012.11.080.

Quantitative phase analysis of bauxites and their dissolution products. Gan, Bee K.; Taylor, Zoe; Xu, Bingan; van Riessen, Arie; Hart, Robert D.; Wang, Xiaodong; Smith, Peter. International Journal of Mineral Processing. Sep2013, Vol. 123, p64-72. 9p.
DOI: 10.1016/j.minpro.2013.05.005.

Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film. Bartosik, M.; Daniel, R.; Mitterer, C.; Matko, I.; Burghammer, M.; Mayrhofer, P.H.; Keckes, J. Thin Solid Films. Sep2013, Vol. 542, p1-4. 4p. DOI: 10.1016/j.tsf.2013.05.102.

Comparing the Success Rate of Raman Spectroscopy and Powder XRD for Routine Mineral Identification. Bartholomew, Paul R. Geostandards and Geoanalytical Research. Sep2013, Vol. 37 Issue 3, p353-359. 7p. DOI: 10.1111/j.1751-908x.2012.00197.x.

Aggregate structure evolution of low-rank coals during pyrolysis by in-situ X-ray diffraction. Li, Meifen; Zeng, Fangui; Chang, Haizhou; Xu, Bingshe; Wang, Wei. International Journal of Coal Geology. Sep2013, Vol. 116-117, p262-269. 8p. DOI: 10.1016/j.coal.2013.07.008.

Raman spectroscopy of gold nanoparticles in polycrystalline LiF film. Kurbatova, N.; Galyautdinov, M.; Ivanov, N.; Kolesnikov, S.; Papernyi, V.; Osin, Yu.; Stepanov, A. Physics of the Solid State. Sep2013, Vol. 55 Issue 9, p1899-1902. 4p. DOI: 10.1134/S1063783413090217.

Nanoparticle detection in aqueous solutions using Raman and Laser Induced Breakdown Spectroscopy. Sovago, Maria; Buis, Ernst-Jan; Sandtke, Marijn. Spectrochimica Acta Part B. Sep2013, Vol. 87, p182-187. 6p. DOI: 10.1016/j.sab.2013.05.033.

Field-Based Raman Spectroscopic Analyses of an Ordovician Stromatolite. Olcott Marshall, Alison; Marshall, Craig P. Astrobiology. Sep2013, Vol. 13 Issue 9, p814-820. 7p.
DOI: 10.1089/ast.2013.1026.

Characterization of AISI 4340 corrosion products using Raman spectroscopy. Hazan, E.; Sadia, Y.; Gelbstein, Y. Corrosion Science. Sep2013, Vol. 74, p414-418. 5p.
DOI: 10.1016/j.corsci.2013.05.002.

The application of confocal technology based on polycapillary X-ray optics in surface topography. Zhao, Guangcui; Sun, Tianxi; Liu, Zhiguo; Yuan, Hao; Li, Yude; Liu, Hehe; Zhao, Weigang; Zhang, Ruixia; Min, Qin; Peng, Song. Nuclear Instruments & Methods in Physics Research Section A. Sep2013, Vol. 721, p73-75. 3p. DOI: 10.1016/j.nima.2013.04.028.

Controlled Surface Enhanced Resonance Raman Scattering (SERRS) in Biological Environment. Lai, Yuming; Li, Feng; Sun, Shuqing. Integrated Ferroelectrics. 2013, Vol. 146 Issue 1, p88-98. 11p. DOI: 10.1080/10584587.2013.789736.

Analysis of lipsticks using Raman spectroscopy. Gardner, P.; Bertino, M. F.; Weimer, R.; Hazelrigg, E. Forensic Science International. 2013, Vol. 232 Issue 1-3, p67-72. 6p.
DOI: 10.1016/j.forsciint.2013.07.007.

XRD study of the kinetics of β ↔ α transformations in tin. Nogita, K.; Gourlay, C.M.; McDonald, S.D.; Suenaga, S.; Read, J.; Zeng, G.; Gu, Q.F. Philosophical Magazine. Sep2013, Vol. 93 Issue 27, p3627-3647. 21p. DOI: 10.1080/14786435.2013.820381.

Elemental analysis of white electrical tapes by wavelength dispersive X-ray fluorescence spectrometry. Sun, Zhenwen; Quan, Yangke; Sun, Yuyou. Forensic Science International. 2013, Vol. 232 Issue 1-3, p169-172. 4p. DOI: 10.1016/j.forsciint.2013.07.009.


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