EasyX is an easy to use software package for completely integrated measurement and analysis of X-ray diffraction data. Crystalline phases can be automatically measured, identified...
Various types of detectors have previously been used in X-ray diffractometers(1). Scintillation counters (SC) have been used as zero-dimensional (0D) detectors, position-sensitive proportional counters (PSPC) and semiconductor detectors as...
SmartLab 3 offers continued refinement of the original ease of use features awarded the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam...
Rigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features...
In modern society where our daily environment is supported by various electronic devices, it is critical to pursue opto-electronic or power-electronic devices with less environment...
Although high-resolution X-ray diffraction (HR-XRD) has been commonly employed for the crystallinity characterization of GaN-related materials, special care is required due to the complexities resulting...
In X-ray diffractometry, a variety of detectors are used depending on the purpose of the measurement. In recent years, in addition to the previously used...
In our previous report, we introduced the concept of GI-XRD (grazing-incidence X-ray diffraction) with a 2-dimensional (2D) detector for thin film samples. However, it seems...
In a crystal, atoms or molecules are arranged in a three-dimensional, repetitive pattern, and the properties of the crystal are determined by the chemical composition...
The discovery of graphite and its industrial use dates back to the 16th century, more than 200 years before the first industrial revolution, which took...