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产品展示
Products 1
XRD
WDXRF
EDXRF
TXRF
SAXS
Products 2
Single crystal
半导体
Handheld Raman
Process control
Non-destructive testing
Products 3
X-ray CT
X 射线地形测绘
Evolved gas analysis
Stress analysis
Thermal analysis
Products 4
Detectors
Optics
真空密封装置
X-ray sources
行业
Industry 1
半导体
Battery
光伏
金属和合金
Food and Food Ingredients
Pharmaceuticals
Industry 2
水泥
聚合物、塑料和橡胶
石油和石化
化学
纳米技术
Life Science
Industry 3
化妆品
采矿和提炼
地质和矿产
环境和污染
安全和安防
取证和保护
Industry 4
Non-destructive testing (NDT)
教育
Advanced and New Materials
涂料和薄膜
材料科学
应用
Applications 1
化学成分
晶体取向
元素分析
危险化学品威胁
手持式拉曼光谱仪
体内应用
Applications 2
显微断层摄影术(X 射线 CT)
微衍射
Molecular imaging
麻醉剂/毒品
粒径和形状
PDF analysis
Applications 3
聚合物和纤维
同质多形体
孔径分布
粉末晶体学
蛋白质晶体学
定性分析
Applications 4
定量分析
原料鉴定
残余应力分析
Rietveld 分析
SAXS
半导体计量
Application 5
单晶 X 射线衍射
光谱学
硫分析
织构和极图
薄膜分析
X 射线反射 (XRR)
支持
Support 1
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即将进行的网络研讨会
Upcoming Events
过往的网络研讨会
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SmartLab
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Product line
Multipurpose
SAXS
XRD
Industries
Materials science
(3)
Nanotechnology
(3)
Advanced and new materials
(2)
Chemistry
(2)
Geology & minerals
(2)
Pharmaceuticals
(2)
Battery
(1)
Cement
(1)
Coatings
(1)
Cosmetics
(1)
Environmental
(1)
Petroleum & petrochemicals
(1)
Photovoltaic manufacturing
(1)
Polymers, plastics & rubber
(1)
Semiconductor manufacturing
(1)
(-)
Academic research
(3)
Analytical techniques
Protein crystallography
Single crystal X-ray diffraction
Chemical crystallography
X-ray fluorescence (XRF)
Thermal analysis
SAXS
X-ray diffraction (XRD)
High-temperature XRD
Powder crystallography
Rietveld analysis
High-resolution XRD
Low-temperature diffraction
Microdiffraction
Non-destructive testing
Residual stress analysis
Computed tomography
SAXS (biological)
SAXS (industrial)
SAXS (polymers and gels)
XRD-DSC
Direct X-ray detection
Microtomography
Powder diffraction
X-ray reflectometry (XRR)
(-)
In-plane diffraction
Applications
Composition identification
Qualitative analysis
Quantitative analysis
SAXS (industrial)
Thin film analysis
Crystal orientation
High-resolution XRD
High-temperature XRD
Low-temperature diffraction
Pore size distribution
Powder crystallography
Residual stress analysis
Rietveld analysis
SAXS (polymers and gels)
Texture and pole figures
Batteries
In-plane diffraction
Microdiffraction
Particle size and shape
Polymers and fibers
Polymorphs
Semiconductor metrology
X-ray reflectometry
XRD-DSC