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New products from Rigaku

CQL Narc-ID Handheld 1064 nm Raman Analyzer

Provides presumptive identification of narcotics, precursor chemicals, and cutting agents

DSCvesta2

DSC with industry-first self-diagnostic feature and industry's highest temperature range

XSPA-500K Ultrahigh-speed Hybrid Photon Counting 2D X-ray Detector

Measures seamless and homogeneous image data across the whole detection area

XSPA-1M Ultrahigh-speed Hybrid Photon Counting 2D X-ray Detector

Measures seamless and homogeneous image data across the whole detection area

XSPA-4M Ultrahigh-speed Hybrid Photon Counting 2D X-ray Detector

Measures seamless and homogeneous image data across the whole detection area

Rigaku CQL Max-ID

Offers features and benefits that maximize chemical threat analysis in safety and security applications

ZSX Primus III NEXT

Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples

CQL Gen-ID

A cost-effective solution for departments looking for targeted chemical threat analysis

XSPA-400 ER seamless multidimensional pixel detector

high energy resolution pixel detector capable of 0, 1, and 2D measurements

MiniFlex XpC

Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work

MILabs U-PET

Ultrahigh definition, dynamic and whole-body PET.

MILabs VECTor

VECTor multimodality platform

MILabs U-CT

Ultrahigh definition, dynamic and whole-body PET.

XtaLAB Synergy-ED

A new and fully integrated electron diffractometer for measuring submicron crystals, utilizing a seamless workflow from data collection to structure determination of crystal structures

MILabs U-SPECT

The only preclinical SPECT system featuring stationary detectors surrounding the animal.

MILabs U-OI

Versatile optical imaging system for bioluminescence and fluorescence applications.

Wavelength dispersive X-ray fluorescence chlorine analyzer

WDXRF ultralow chlorine analyzer

XHEMIS EX-2000

This versatile X-ray metrology tool enables high-throughput measurements on blanket wafers ranging from ultra-thin single-layer films to multilayer stacks for process development and film quality control.