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New products from Rigaku

A curved single crystal X-ray diffraction detector based on direct X-ray detection technology with a higher 2θ range compared to a flat detector.

Curved Photon Counting X-ray Detector

A modernized 2D Kratky system that eliminates data corrections required of traditional systems

A modern 2D Kratky SAXS camera

XRF and optical metrology tool for blanket and patterned wafers; up to 300 mm wafers

Onyx Hybrid XRF and Optical metrology FAB tool

This versatile X-ray metrology tool enables high-throughput measurements on blanket wafers ranging from ultra-thin single-layer films to multilayer stacks for process development and film quality control.

XHEMIS EX-2000

Robotic sample changer to provide unattended data acquisition, enhanced productivity and standardized workflow to your research environment.

XtaLAB Synergy Flow

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

ZSX Primus IVi  Tube-Below Sequential WDXRF Spectrometer ZSX Primus 4