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New products from Rigaku

A modernized 2D Kratky system that eliminates data corrections required of traditional systems

A modern 2D Kratky SAXS camera

XRF and optical metrology tool for blanket and patterned wafers; up to 300 mm wafers

Onyx Hybrid XRF and Optical metrology FAB tool

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

ZSX Primus IVi  Tube-Below Sequential WDXRF Spectrometer ZSX Primus 4