High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
Foreign object X-ray inspection instrument
Foreign object X-ray inspection instrument
High-resolution benchtop microtomography of large samples
Foreign object X-ray inspection instrument
200 kV microcomputerized directional industrial X-ray system
High-speed, stationary sample microtomography of large samples
300 kV microcomputerized directional industrial X-ray system
Small, light weight non-destructive testing X-ray generator