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Materials science

Materials science

Element / phase analysis and molecular structure

Characterization and compositional analysis of substances like metals, ceramics or plastics that are part of any application—including space science, defense technology or any other kind of technology or product—are key in material science. X-ray technology can investigate elemental composition and layer thickness by X-ray Fluorescence (XRF) in semiconductors or other new materials. X-ray Diffraction and Scattering are primary techniques to study crystalline phases, their degree of crystallinity or crystallographic structure and orientation, texture or residual stress. XRT (X-ray topography) investigates crystalline defects in advanced materials like semiconductors, and X-ray reflectometry (XRR) measures layer thicknesses, roughness and interlayer diffusion. Associated diffuse scattering methods like SAXS examine the nature of the molecular structure of films, coatings and layers or particles in disciplines like biology, chemistry, physics, and engineering. Rigaku advanced technology and experience provide a variety of non-destructive, state-of-the-art analytical solutions and services for your materials. 

Application Notes

The following application notes are relevant to this industry


Small Molecule, Single crystal


X-ray Imaging



Protein, Single crystal

X-ray CT, Computed tomography

Single crystal, XRD

Total reflection XRF (TXRF)

Rigaku recommends the following systems:

Single crystal

Our most popular diffractometer for chemical crystallography, configured with either single or dual microfocus sealed tube X-ray sources and an extremely low noise direct X-ray detection detector.

A benchtop single crystal X-ray diffractometer ideal for self-service crystallography and teaching.

A modern single crystal X-ray diffractometer for structural analysis of small molecule samples configured with microfocus sealed tube technology and a direct X-ray detection detector.

An extremely high-flux rotating anode X-ray diffractometer specifically configured for measuring difficult samples.

A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.


New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

High-performance, multi-purpose XRD system for applications ranging from R&D to quality control


Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods

Small Molecule

User-inspired data collection and data processing software for small molecule and protein crystallography

X-ray CT

High-speed, stationary sample microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

High-resolution benchtop microtomography of large samples

Thermal Analysis

TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).



TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.


DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.

TMA/HUM measures change in dimension or mechanical property of a sample while subjected to a temperature regime under water vapor atmosphere with a constant relative humidity.

Thermo Mass Photo combines simultaneous thermal analysis with mass spectrometry. This technique is suitable for the qualitative analysis of  evolved gases coincident with the STA signal.

The compact humidity generator (HUM-1) is connected to the TG-DTA for measurements under constant relative humidity water vapor atmosphere.


DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.


2D X-ray detector with latest semiconductor technology designed for home lab diffractometers