Multilayer optics for X-ray analysis
Since W. von Laue discovered X-ray diffraction using a zinc sulfide single crystal in 1912, single crystals including Si, Ge, LiF, etc. have been used...
Since W. von Laue discovered X-ray diffraction using a zinc sulfide single crystal in 1912, single crystals including Si, Ge, LiF, etc. have been used...
There is a flood of high-tech functional devices made up of thin films. Cell phones and personal computers are integrated units of thin film devices...
In order to solve various problems in materials, there are very high demands for crystal structure analysis. However, most materials used in industries are in...
Ultima IV is an advanced and versatile X-ray diffraction system equipped with a precision-engineering horizontal- sample X-ray diffractometer together with a conventional X-ray generator and...
D/teX Ultra is a high-speed one-dimensional X-ray detector using a state-of-the-art semiconductor device, and has a superior X-ray detection capability and energy resolution than a...