Measure almost any element in almost any matrix
X-ray fluorescence (XRF) provides one of the simplest, most accurate and most economic analytical methods for the determination of elemental composition of many types of materials. Indispensable to both R&D and quality assurance (QA) functions, our advanced and unique WDXRF products are routinely used to analyze products from cement to plastics and from metals to food to semiconductor wafers. Rigaku offerings range from high power, high-performance wavelength dispersive WDXRF systems, for the most demanding applications, to a complete line of benchtop EDXRF and WDXRF systems.
Application notes
The following application notes are relevant to this applicationEDXRF
WDXRF
Process
Total reflection XRF (TXRF)
X-ray topography (XRT)
Rigaku recommends the following systems:
Total reflection XRF (TXRF)
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer
Handheld laser induced breakdown (LIBS) spectrometer for fast and accurate alloy identification
WDXRF
Sequentielles WDRFA Spektrometer zur Analyse der Elemente von O bis U in Feststoffen, Flüssigkeiten und Pulvern
Sequenzielles WDRFA-Spektrometer mit hoher Leistung, Röhre oberhalb der Probe, mit ZSX Guidance Systemsoftware
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U
EDXRF
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films
