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Elemental Analysis

Elemental analysis

Measure almost any element in almost any matrix

X-ray fluorescence (XRF) provides one of the simplest, most accurate and most economic analytical methods for the determination of elemental composition of many types of materials. Indispensable to both R&D and quality assurance (QA) functions, our advanced and unique WDXRF products are routinely used to analyze products from cement to plastics and from metals to food to semiconductor wafers. Rigaku offerings range from high power, high-performance wavelength dispersive WDXRF systems, for the most demanding applications, to a complete line of benchtop EDXRF and WDXRF systems.
 

 

Application notes

The following application notes are relevant to this application

WDXRF

EDXRF

Process

Total reflection XRF (TXRF)

X-ray topography (XRT)

Rigaku recommends the following systems:


Total reflection XRF (TXRF)

The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer

Handheld laser induced breakdown (LIBS) spectrometer for fast and accurate alloy identification

WDXRF

Sequentielles WDRFA Spektrometer zur Analyse der Elemente von O bis U in Feststoffen, Flüssigkeiten und Pulvern

Sequenzielles WDRFA-Spektrometer mit hoher Leistung, Röhre oberhalb der Probe, mit ZSX Guidance Systemsoftware

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

WDXRF spectrometer designed to handle very large and/or heavy samples

High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U

EDXRF

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

EDXRF spectrometer with powerful Windows® software and optional FP.

Process

Scanning multi-element process coatings analyzers for web or coil applications