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Chemistry

Chemistry

The composition, structure, properties, behavior and changes substances undergo during a reaction with other substances or in different environmental conditions are important material characteristics. Element analysis of the main components and trace elements can be performed with X-ray fluorescence (XRF), and crystal structure determination and phase analysis and quantification are studied with X-ray diffraction (XRD) in your lab or fab. X-ray analysis examines powders, solids, liquids, pastes, films or single crystals. Rigaku offers a wide range of solutions for both academic research and industrial applications for any composition and type of structural information obtainable by X-rays: XRD (X-ray diffraction) in combination with DSC, CT (computed tomography), handheld Raman, SAXS (small angle X-ray scattering), WAXS (wide angle X-ray scattering), XRR (X-ray reflectivity), and XRT (X-ray topography).

 

Rigaku recommends the following systems:


WDXRF

Sequentielles WDRFA Spektrometer zur Analyse der Elemente von O bis U in Feststoffen, Flüssigkeiten und Pulvern

High power, tube above, sequential WDXRF spectrometer

High power, tube above, sequential WDXRF spectrometer

Single crystal

Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab

A benchtop single crystal X-ray diffractometer with the latest technology HPC X-ray detector, ideal for self-service crystallography.

An upgradeable single crystal X-ray diffractometer for structural analysis of small molecule samples

Single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator

Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments

Single crystal X-ray diffractometer with custom enclosure and flexibility for easy integration of accessory components

A unique curved single crystal X-ray diffraction detector

XRD

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

High-performance, multi-purpose XRD system for applications ranging from R&D to quality control

Small Molecule

User-inspired data collection and data processing software for small molecule and protein crystallography

Automated tool for performing in situ crystallography experiments on existing X-ray diffractometers

Protein

Automated tool for performing in situ crystallography experiments on existing X-ray diffractometers

Automated crystal transport, orientation and retrieval robot

Versatile and high-flux dual-wavelength (DW) X-ray diffractometer with HPC X-ray detector for multipurpose diffraction experiments

EDXRF

Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

EDXRF spectrometer with powerful Windows® software and optional FP.

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

Detectors

Low noise, sensitive, air-cooled X-ray detector for superior X-ray diffraction data quality

2D X-ray detector with latest semiconductor technology designed for home lab diffractometers

Compact, highly sensitive X-ray detector for single crystal applications

A unique curved single crystal X-ray diffraction detector

X-ray CT

High-speed, stationary sample microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

High-resolution benchtop microtomography of large samples

Optics

Single wavelength Confocal Max-Flux (CMF) optics for single crystal diffraction

Dual wavelength Confocal Max-Flux (CMF) optics for single crystal X-ray diffraction