For elemental and chemical analysis
Spectroscopy is the study of the interaction between matter and electromagnetic radiation. Historically, spectroscopy originated through the study of visible light dispersed according to its wavelength, by a prism or grating. Later the concept was expanded greatly to include any interaction with radiative energy as a function of its wavelength or frequency. Spectroscopic data are often represented by an emission, absorption or Raman spectrum, a plot of the response of interest as a function of wavelength or frequency.
X-ray Fluorescence (XRF)
XRF is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by bombarding with high-energy X-rays rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics, and building materials, and for research in geochemistry, forensic science, archaeology and art objects. Rigaku offer a wide range of EDXRF and WDXRF spectrometers.
Raman spectroscopy relies on inelastic scattering, or Raman scattering, of monochromatic light, usually from a laser in the visible, near infrared, or near ultraviolet range. The laser light interacts with molecular vibrations, phonons or other excitations in the system, resulting in the energy of the laser photons being shifted up or down. The shift in energy gives information about the vibrational modes in the system. Infrared spectroscopy yields similar, but complementary, information. Rigaku offers a range of handheld Raman spectrometers.
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
The original handheld 1064 nm Raman analyzer to expand incident response by identifying more chemical threats and narcotics
Narcotics-focused analyzer to identify the latest opioid and fentanyl formations
Improved ergonomics for more convenient identification and detection of chemical threats and narcotics – even in non-visible amounts - using the 1064 nm Raman advantage
Total reflection XRF (TXRF)
The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer
Handheld laser induced breakdown (LIBS) spectrometer for fast and accurate alloy identification
Sequentielles WDRFA Spektrometer zur Analyse der Elemente von O bis U in Feststoffen, Flüssigkeiten und Pulvern
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
ASTM D2622 method WDXRF analyzer for sulfur (S) in petroleum fuels and ULSD
Tube below, single element WDXRF analyzer for quality control applications
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
EDXRF spectrometer with powerful Windows® software and optional FP.