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Mining and refining

Mining and refining

Analysis of ores, feeds, slag, tails and metals

Rigaku instruments are used for elemental and mineralogical analysis for efficient, green and high-quality production. X-ray Fluorescence (XRF) and X-ray Diffraction (XRD) can be used to determine, for example, metal-oxide concentrations, oxide stoichiometry and quantities of mineralogical phases, which are crucial for your mining, refining and production processes. Rigaku offers a variety of solutions for your R&D laboratory, for routine production and process control, as well as cost-effective benchtop equipment, fulfilling the analytical requirements of industry standards. All of this is combined with excellent service and support structure for guaranteed equipment uptime.

Rigaku recommends the following systems:


Sequentielles WDRFA Spektrometer zur Analyse der Elemente von O bis U in Feststoffen, Flüssigkeiten und Pulvern

High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

Sequenzielles WDRFA-Spektrometer mit hoher Leistung, Röhre oberhalb der Probe, mit ZSX Guidance Systemsoftware

High power, tube above, sequential WDXRF spectrometer

High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software


New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification


Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

EDXRF spectrometer with powerful Windows® software and optional FP.

X-ray CT

High-speed, stationary sample microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

High-resolution benchtop microtomography of large samples