Elemental / phase analysis to molecular structure
Governments and industry collectively invest billions of dollars every year into the research and development of advanced materials. This work involves study of the characteristics and uses of various substances, such as metals, ceramics, and plastics, that are employed in applications ranging from space science and defense technology to consumer products. X-ray diffraction (XRD) is a primary technique for the study of advanced materials, including investigation of the following properties: identification and quantification of phases, determination of the degree of crystallinity in phases, crystallographic structure, crystal orientation and texture, residual stress analysis, thin film thickness and properties, pore sizes, as well as much more. The influence of non-ambient conditions on these properties is also routinely studied with the XRD technique. Investigations may be carried out on samples of varying types, from powders, to solid materials of varying shapes and size, to solutions and semiconductor wafers. Rigaku technology and expertise provide a number of unique solutions for materials science applications.
Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab
A benchtop single crystal X-ray diffractometer with the latest technology HPC X-ray detector, ideal for self-service crystallography.
An upgradeable single crystal X-ray diffractometer for structural analysis of small molecule samples
Single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator
User-inspired data collection and data processing software for small molecule and protein crystallography
Single crystal X-ray diffractometer with custom enclosure and flexibility for easy integration of accessory components
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software
High power, tube above, sequential WDXRF spectrometer
WDXRF spectrometer designed to handle very large and/or heavy samples
New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films
High-speed, stationary sample microtomography of large samples
X-ray topography (XRT)
A fast, high-resolution laboratory X-ray topography system for non-destructive dislocation imaging
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.
DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.
TMA/HUM measures change in dimension or mechanical property of a sample while subjected to a temperature regime under water vapor atmosphere with a constant relative humidity.
Thermo Mass Photo combines simultaneous thermal analysis with mass spectrometry. This technique is suitable for the qualitative analysis of evolved gases coincident with the STA signal.
The compact humidity generator (HUM-1) is connected to the TG-DTA for measurements under constant relative humidity water vapor atmosphere.
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
Compact, highly sensitive X-ray detector for single crystal applications
A modernized 2D Kratky system that eliminates data corrections required of traditional systems