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Materials science

Materials science

Element / phase analysis and molecular structure

Characterization and compositional analysis of substances like metals, ceramics or plastics that are part of any application—including space science, defense technology or any other kind of technology or product—are key in material science. X-ray technology can investigate elemental composition and layer thickness by X-ray Fluorescence (XRF) in semiconductors or other new materials. X-ray Diffraction and Scattering are primary techniques to study crystalline phases, their degree of crystallinity or crystallographic structure and orientation, texture or residual stress. XRT (X-ray topography) investigates crystalline defects in advanced materials like semiconductors, and X-ray reflectometry (XRR) measures layer thicknesses, roughness and interlayer diffusion. Associated diffuse scattering methods like SAXS examine the nature of the molecular structure of films, coatings and layers or particles in disciplines like biology, chemistry, physics, and engineering. Rigaku advanced technology and experience provide a variety of non-destructive, state-of-the-art analytical solutions and services for your materials. 

Rigaku recommends the following systems:


Single crystal

Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab

A benchtop single crystal X-ray diffractometer with the latest technology HPC X-ray detector, ideal for self-service crystallography.

An upgradeable single crystal X-ray diffractometer for structural analysis of small molecule samples

Single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator

Single crystal X-ray diffractometer with custom enclosure and flexibility for easy integration of accessory components

XRD

New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification

Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software

Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance

High-performance, multi-purpose XRD system for applications ranging from R&D to quality control

Stress

Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods

Small Molecule

User-inspired data collection and data processing software for small molecule and protein crystallography

WDXRF

High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)

Sequenzielles WDRFA-Spektrometer mit hoher Leistung, Röhre oberhalb der Probe, mit ZSX Guidance Systemsoftware

High power, tube above, sequential WDXRF spectrometer

WDXRF spectrometer designed to handle very large and/or heavy samples

EDXRF

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

X-ray CT

High-speed, stationary sample microtomography of large samples

Ultra-high resolution nanotomography using parallel beam geometry

High-resolution benchtop microtomography of large samples

X-ray topography (XRT)

A fast, high-resolution laboratory X-ray topography system for non-destructive dislocation imaging

Thermal Analysis

TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).

 

 

TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.

 

DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.

TMA/HUM measures change in dimension or mechanical property of a sample while subjected to a temperature regime under water vapor atmosphere with a constant relative humidity.

Thermo Mass Photo combines simultaneous thermal analysis with mass spectrometry. This technique is suitable for the qualitative analysis of  evolved gases coincident with the STA signal.

The compact humidity generator (HUM-1) is connected to the TG-DTA for measurements under constant relative humidity water vapor atmosphere.

 

Detectors

2D X-ray detector with latest semiconductor technology designed for home lab diffractometers

Compact, highly sensitive X-ray detector for single crystal applications

SAXS

A modernized 2D Kratky system that eliminates data corrections required of traditional systems