Element / phase analysis and molecular structure
Characterization and compositional analysis of substances like metals, ceramics or plastics that are part of any application—including space science, defense technology or any other kind of technology or product—are key in material science. X-ray technology can investigate elemental composition and layer thickness by X-ray Fluorescence (XRF) in semiconductors or other new materials. X-ray Diffraction and Scattering are primary techniques to study crystalline phases, their degree of crystallinity or crystallographic structure and orientation, texture or residual stress. XRT (X-ray topography) investigates crystalline defects in advanced materials like semiconductors, and X-ray reflectometry (XRR) measures layer thicknesses, roughness and interlayer diffusion. Associated diffuse scattering methods like SAXS examine the nature of the molecular structure of films, coatings and layers or particles in disciplines like biology, chemistry, physics, and engineering. Rigaku advanced technology and experience provide a variety of non-destructive, state-of-the-art analytical solutions and services for your materials.
Fast, flexible single crystal X-ray diffractometer with the latest generation sources and HPC X-ray detectors, perfect for any crystallography lab
A benchtop single crystal X-ray diffractometer with the latest technology HPC X-ray detector, ideal for self-service crystallography.
An upgradeable single crystal X-ray diffractometer for structural analysis of small molecule samples
Single crystal X-ray diffractometer with high-flux microfocus rotating anode X-ray generator
Single crystal X-ray diffractometer with custom enclosure and flexibility for easy integration of accessory components
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
User-inspired data collection and data processing software for small molecule and protein crystallography
High power, tube below, sequential WDXRF spectrometer with Smart Sample Loading System (SSLS)
Sequenzielles WDRFA-Spektrometer mit hoher Leistung, Röhre oberhalb der Probe, mit ZSX Guidance Systemsoftware
High power, tube above, sequential WDXRF spectrometer
WDXRF spectrometer designed to handle very large and/or heavy samples
New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
High-resolution benchtop microtomography of large samples
X-ray topography (XRT)
A fast, high-resolution laboratory X-ray topography system for non-destructive dislocation imaging
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).
TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.
DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.
TMA/HUM measures change in dimension or mechanical property of a sample while subjected to a temperature regime under water vapor atmosphere with a constant relative humidity.
Thermo Mass Photo combines simultaneous thermal analysis with mass spectrometry. This technique is suitable for the qualitative analysis of evolved gases coincident with the STA signal.
The compact humidity generator (HUM-1) is connected to the TG-DTA for measurements under constant relative humidity water vapor atmosphere.
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers
Compact, highly sensitive X-ray detector for single crystal applications
A modernized 2D Kratky system that eliminates data corrections required of traditional systems