X-ray diffractometer system with single or dual PhotonJet microfocus sources
With your success utmost in our minds, the XtaLAB Synergy has been developed for single crystal X-ray diffraction. Using a combination of leading edge components...
With your success utmost in our minds, the XtaLAB Synergy has been developed for single crystal X-ray diffraction. Using a combination of leading edge components...
The XRTmicron is a topography measurement system which can reduce measurement time by one order of magnitude compared to previous systems by using a new...
X-ray topography is a powerful technique for evaluating crystal defects such as dislocations, stacking faults, scratches, and so on. High–performance electronics devices such as microprocessors...
For more than 50 years, X-ray topography (XRT) has been an indispensable industrial and research tool for crystal growth of functional materials, since crystalline defects...
One of the major technical challenges of this decade are energy efficient technologies, which is among others, comparable in its importance to Artificial Intelligence, 5G...
In straightforward terms, the XtaLAB Synergy-DW diffractometer combines the increased flux of a rotating anode source with the flexibility of two different wavelengths, making it ideal for laboratories...
Abstract
Rigaku launched a high-speed X-ray topography system with the improved throughput of 10–20 wafers/hour (3–6 min/wafer). High-speed image acquisition is achieved using an uncollimated...