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XRF products from Rigaku

The new, next generation benchtop total reflection X-ray fluorescence (TXRF) spectrometer

Sequentielles WDRFA Spektrometer zur Analyse der Elemente von O bis U in Feststoffen, Flüssigkeiten und Pulvern

Sequenzielles WDRFA-Spektrometer mit hoher Leistung, Röhre oberhalb der Probe, mit ZSX Guidance Systemsoftware

High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software

WDXRF spectrometer designed to handle very large and/or heavy samples

High-throughput tube below multi-channel simultaneous WDXRF spectrometer analyzes Be through U

WDRFA Spektrometer für niedrige Schwefelgehalte nach ASTM D2622 und ISO 20884

WDRFA Spektrometer für niedrige Schwefelgehalte nach ASTM D2622 und ISO 20884

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis

Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

Performance EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

EDXRF spectrometer with powerful Windows® software and optional FP.

Scanning multi-element process coatings analyzers for web or coil applications

Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.

Trace elemental surface contamination metrology by TXRF; up to 200 mm wafers.

Trace elemental surface contamination metrology by TXRF; up to 300 mm wafers

Ultra-trace elemental surface contamination metrology by TXRF with VPD capability; up to 300 mm wafers