On October 9th, 2009 three scientists were awarded the Nobel Prize in Chemistry “for studies of the structure and function of the ribosome”. The awardees...
X-ray diffraction intensities from a thin film deposited on a substrate can be relatively weak in comparing to the enormous X-ray diffraction and background intensities...
There is growing demand for high precision and sensitivity micro-spot elemental analysis of microelectronic components. EPMA (electron probe micro analyzer) and EDXRF (energy-dispersive X-ray fluorescence)...
The International Confederation for Thermal Analysis and Calorimetry (ICTAC) defines thermomechanical analysis (TMA) as a method of thermal analysis in which the temperature of a...
In X-ray powder diffraction analysis, obtaining high resolution and high intensity diffraction data leads to the improved accuracy of analyses based on that data, such...
X-ray powder diffraction (XPD) analysis has been widely used in the field of materials science, such as materials development or quality control for over fifty...
Recently, various thin film and multilayer materials are being developed and produced for use as functional devices. The characteristics of such a device are often...