Element & phase analysis, particle sizes and molecular structure
For all tasks in polymer research, development and production quality control, X-ray Fluorescence (XRF) analysis can identify and quantify the concentrations of additives (pigments, fillers, flame retardants, stabilizers) such as antimony, barium, bromine, calcium, chromium (in accordance with RoHS/WEEE regulations), copper, phosphorus, titanium or zinc. In addition, many plastic polymers have some degree of order that can be identified and studied by X-ray Diffraction (XRD) methods. The percent crystallinity—measured with XRD—can correlate to processing methods. The determination of unit cell type, lattice parameters, microstructure and crystallographic orientation through pole figures can be of importance. Periodic or crystalline structures on the nanoscale can be examined by Small Angle X-ray Scattering (SAXS) and Wide Angle X-ray Scattering (WAXS). Rigaku offers comprehensive Instruments and services for all methods.
Application Notes
The following application notes are relevant to this industryEDXRF
X-ray Imaging
EGA, Thermal Analysis
XRD
Process
Thermal Analysis
WDXRF
SAXS
EGA
X-ray CT, Computed tomography
Rigaku recommends the following systems:
WDXRF
El espectrómetro secuencial WDXRF con tubo inferior de sobremesa, analiza de O a U en sólidos, líquidos y polvos.
Espectrómetro secuencial WDXRF de alta potencia, de tubo superior con nuevo software de sistema experto Guidance (Guía) ZSX.
High-power, tube-below, sequential WDXRF spectrometer with new ZSX Guidance expert system software
XRD
Nuevo sistema XRD de sobremesa de uso general de sexta generación para identificación y cuantificación de fase
Difractómetro de rayos X multipropósito altamente versátil con guía inteligente incorporada
Sistema XRD multipropósito de alto rendimiento para aplicaciones que van desde I+D hasta el control de calidad.
EDXRF
El analizador elemental EDXRF de bajo costo mide de Na a U en sólidos, líquidos, polvos y películas delgadas
El analizador elemental EDXRF de rendimiento mide de Na a U en sólidos, líquidos, polvos y películas delgadas
El analizador elemental EDXRF de geometría cartesiana de alto rendimiento mide de Na a U en sólidos, líquidos, polvos y películas delgadas
SAXS
Un sistema Kratky 2D modernizado que elimina las correcciones de datos requeridas por los sistemas tradicionales
X-ray CT
Thermal Analysis
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).