Since W. von Laue discovered X-ray diffraction using a zinc sulfide single crystal in 1912, single crystals including Si, Ge, LiF, etc. have been used as analyzing crystals for X-ray analysis. However, as the research and applications of X-rays advanced, the wavelength region also extended significantly. Analyzing crystals made of...
There is a flood of high-tech functional devices made up of thin films. Cell phones and personal computers are integrated units of thin film devices, so are TV displays, recording media such as CD/DVD, their write/playback apparatuses, etc. X-ray measurement techniques are widely used for characterizing various thin-film materials and...
In order to solve various problems in materials, there are very high demands for crystal structure analysis. However, most materials used in industries are in powdery or polycrystalline states, and it is often quite hard to obtain single crystals for some materials. Structure analysis from X-ray powder diffraction can be...
There are growing demands for mineral resources around the world, and rapid and accurate elemental analysis is required at a satellite laboratory in a mining site for quality check, geological resource survey, etc. One of the Rigakus solutions for such requirements is the compact-size light-weight benchtop wavelength dispersive X-ray fluorescence...
Ultima IV is an advanced and versatile X-ray diffraction system equipped with a precision-engineering horizontal- sample X-ray diffractometer together with a conventional X-ray generator and a sealed-off X-ray tube. Ultima IV is specially designed to allow for simple and reproducible changeovers form one selected configuration to another and vice versa...
In recent years, with new developments in industrialized countries, there are increasing demands for the analysis of rare metals and other mineral resources. Supermini, a 200-W benchtop wavelength dispersive X-ray fluorescence spectrometer (WDX), has been developed to meet these demands. Supermini is a compact sized benchtop instrument without requiring cooling...
D/teX Ultra is a high-speed one-dimensional X-ray detector using a state-of-the-art semiconductor device, and has a superior X-ray detection capability and energy resolution than a conventional one-dimensional semiconductor X-ray detector. The advantages of a D/teX Ultra detector include: a drastic reduction of the measurement time, an acquisition of high-intensity diffraction...
