We have improved the conventional micro area stress measurement system (AutoMATE) by replacing the gas flowing detector Position Sensitive Proportional Counter (PSPC) with a semiconductor detector, the D/teX Ultra 1000. This new AutoMATE II provides the user with new functions, high sensitivity, high counting rate and good energy resolution. Maintenance of the AutoMATE II is much easier than that of AutoMATE because there is no longer the need to flow PR gas. The higher sensitivity of the D/teX Ultra 1000 enables the user to perform micro-area stress measurements in less time. The high counting rate capability of the D/teX Ultra 1000 means that the stress measurement of crystalline materials having coarse grains or textures can be performed easily.