SmartLab is the world’s first high resolution diffractometer with horizontal sample mounting theta-theta geometry. Designed for the structural analysis of advanced materials and thin films, the system combines a uniquely flexible instrument geometry with a comprehensive knowledge-based software platform. SmartLab is exceptional in that it enables users with little or no expertise in diffraction methods to make advanced structural measurements quickly and easily.
Applications for the SmartLab exist across a wide range of disciplines, from basic research to process development, and materials production. Example areas of interest include: organic films, epitaxial films for semiconductor and optical devices, metal and alloy nano-particles, and magnetic films for next generation recording media.