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SmartLab Studio II

SmartLab Studio II

Common features

  • Seamless operations from measurement to reporting by single software platform
  • It covers basic XRPD applications, e.g. qualitative, quantitative, crystallite size, Rietveld analysis, as well as advanced analysis, e.g. X-ray reflectivity, HRXRD, pole figure and PDF.
  • Clustering analysis and Data Visualization supports various data treatments
  • Support FDA 21 CFR Part 11 data integrity
  • Network dongle provides software licenses maximum 10 PCs

XRD Measurement plugin

  • User Guidance guides instrument operation for beginners and experts
  • Wizard recommends measurement conditions to users depending on sample types
  • One click operation from measurement to analysis if defined
  • Measurement and analysis on 0-, 1- and 2-D data
  • In-situ and operando measurements support synchronizing with external device

Powder XRD plugin

  • Unified interface from qualitative analysis to structure determination
  • Direct Derivation (DD) method for quantification from crystalline to amorphous samples
  • Whole powder patten fitting (WPPF) based on Fundamental Parameters (FP) approach
  • Supporting norms defined by ASTM, JIS and NIOSH/OSHA for respirable silica and retained austenite analysis
  • Direct phase identification from 2-D data utilizing crystallite size information

XRR plugin

  • Flow bar guides user and provides necessary analysis steps to complete
  • Oscillation analysis helps modeling the sample structure
  • Density profile is graphically displayed across sample thickness
  • Segmented measurement ranges maximize dynamic range of the data
  • Simultaneous fittings on more than two data sets measured by different resolutions to extract one sample structure that includes largely different thicknesses

HRXRD plugin

  • Dynamical simulation fitting on high-resolution XRD (HRXRD) data and analysis of high-resolution reciprocal space mapping (RSM)
  • Support all 230 space groups of crystal structures
  • Stress-relaxation and composition analysis from asymmetric RSM
  • Indexing on measured RSM
  • Lattice parameters and strain calculation from RSM

Texture plugin

  • Pole figure representation and Orientation Distribution Function (ODF) analysis
  • Representation and analysis on complete pole figures obtained from transmission and reflection measurements
  • Analysis of preferred orientation direction (hkl)[uvw] and its volume fraction
  • Inverse pole figure calculation
  • Kearns and Herman’s orientation functions for quantitative analysis

Stress plugin

  • Sin2ψ, 2D-stress and Multiple HKL methods are supported
  • Residual stress analysis from bulk to thin film samples
  • Principal and tri-axial residual stress analysis using 2-D method
  • Stiffness tensor or Young’s modulus & Poisson’s ratio for calculation

MRSAXS plugin

  • Particle size and distribution analysis from 1-D or 2-D SAXS data
  • Size distribution, average, percentile D10, D50, D90 are calculated
  • Sample that does not transmit visible light can be analyzed
  • Analyze on sample with multiple particle size distributions

PDF plugin

  • Calculation of structure function S(Q) and pair distribution function (PDF)
  • Overlay calculated atomic distances from crystal structure on PDF data
  • PDF calculation from multiple data measured by different energies of X-ray
  • Reasonable S(Q) and PDF profiles by ripple correction
  • Exporting PDF profile to PDFgui and RMCProfile software

Data Visualization plugin

  • Analyze and display of multiple data
    • • 1-D data waterfall plot
    • • 2-D & 1-D data slideshow
  • in-situ and operando data treatment and representation
  • Temperature vs. XRD, Differential Scanning Calorimetry (DSC) profile vs. XRD data representation
  • Importing & linking data from an external device, e.g. potentiometer with XRD data
  • Spatial mapping data analysis and representation overlayed with sample snap-shot image
  • Extracting data from selected point or area on a spatial mapping data
  • Synchronization with analysis software plugins, e.g. PowderXRD, Stress, XRR and HRXRD, to analyze multiple data
  • Displaying analyzed results by analysis software plugin, e.g. phase, stress, thickness, together with spatial mapping data and snap-shot sample image
  • Statistical calculation of analyzed results by analysis software plugin over an area mapped

XRD-DSC plugin

  • Representing Differential Scanning Calorimetry (DSC) and XRD profiles against time and temperature
  • Analysis of DSC profile, e.g. starting temperature of exo- and endothermic reactions, energies absorbed and released
  • Visualize crystallographic phase change depending on time

Software suite for Rigaku X-ray diffractometers

Integrates user privileges, measurements, analyses, data visualization and reporting

SmartLab Studio II is a new Windows®-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components. Just one click switches from measurement to analysis. Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop by selecting an appropriate layout. The software provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc.

SmartLab Studio (SLSII)

 

Powder XRD: phase identification with a variety of available databases

Peak position, FWHM, integrated intensity and crystallite size are calculated by profile fitting. Rigaku’s optional “Hybrid Search/Match” uses peak-base qualification, which detects heavily distorted lattices, to identify solid solution phases that are difficult to identify. It also can determine whether preferred orientation exists based on decomposed peak intensities.

SmartLab Studio II (SLSII)

 

Powder XRD: quantification package

This option supports internal standard, external standard, and standard addition calibration methods. Calibration curves are used to quantify specific phases in the sample.

SmartLab Studio II Quant

 

Powder XRD: comprehensive analysis package

This optional package can provide analysis results such as crystalline size, lattice strain, lattice parameters refinement, % crystallinity based on fully automated profile fitting executed after loading measured data. Results obtained aid in understanding the relationship between structure and physical properties, and allow users to compare results across different samples.

SLS-II Comprehensive

 

Powder XRD: direct derivation analysis package

The direct derivation (DD) method was invented by Professor Hideo Toraya of Rigaku Corporation in 2016. It quantifies phases from all integrated diffraction intensities and the chemical formulas of each phase found. Compared to the classical RIR method, where a single integrated peak intensity and RIR number are used, the DD method is less affected by preferred orientation and peak overlap.

SmartLab Studio II DD method

 

Powder XRD: Rietveld analysis package

The package performs phase identification followed by Whole Powder Pattern Fitting (WPPF). The Rietveld analysis refines crystal structure or quantifies the phases directly from measured data, requiring neither reference samples nor a calibration curve. The whole powder pattern decomposition (Pawley method) is based on both the measured peak positions, and peaks shapes.

SLSII Rietveld

 


Learn more about our products at these events

Booth number Date Location Event website
International Hazardous Materials Response Teams Conference 2021 - Virtual Experience Website
Thermal Analysis Webinar Series Focusing On STA-FTIR Application Webinar Register Now!
TOPIQ | Introduction of X-ray Analysis Solutions for Battery Materials Webinar Register Now!
Heliospir - Nantes, France Website
TOPIQ | Measurement And Analysis Of Single Crystal Diffuse Scattering. Webinar Register Now!
Sample preparation & high-performance benchtop XRF spectrometry as an analytical tool in the construction industry Webinar Register
Thermal Analysis Technical Seminar - Let‘s evaluate materials with STA(TG-DTA/TG-DSC): Principles, Applications and Tips Webinar Register
TOPIQ | SmartLab XRD solution for semiconductor materials Webinar Register Now!
Rigaku High Pressure Workshop - Online workshop Register Now!
ACA 2021 - Virtual Event Website
NGAUS 2021 - Las Vegas, NV Website
Ceramics Expo 2021 - Cleveland, OH Website
Aluminum USA 2021 - Louisville, KY Website
IACP 2021 - New Orleans, LA Website
FABTECH 2021 - Chicago, IL Website
CARS Recycling Show H2 - Coventry, UK Website
ALUMINIUM 2021 11L73 - Dusseldorf, Germany Website
Forum Labo - Paris, France Website
Gulf Coast Conference (GCC 2021) - Galveston, TX Website
EASTEC 2021 - West Springfield, MA Website
ACS MWRM 2020 - Springfield, MO Website
CBRNe Convergence 2021 - Orlando, FL Website
ARABLAB 2020 - Dubai, UAE Website
WESTEC 2021 - Long Beach, CA Website
International Chemical & Petroleum Industry Inspection Tech Conference - Sugar Land, TX Website