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SmartLab
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
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Stress
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SAXS
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(1)
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(1)
(-)
Metals & alloys
(2)
(-)
Coatings
(1)
Analytical techniques
X-ray fluorescence (XRF)
Computed tomography
Microtomography
High-temperature XRD
Low-temperature diffraction
Non-destructive testing
Powder crystallography
Rietveld analysis
X-ray diffraction (XRD)
High-resolution XRD
In-plane diffraction
Microdiffraction
Powder diffraction
Process control
SAXS
X-ray reflectometry (XRR)
(-)
Residual stress analysis
(-)
XRD-DSC
Applications
Residual stress analysis
Non-destructive testing
Batteries
Composition identification
Crystal orientation
High-resolution XRD
High-temperature XRD
In-plane diffraction
Low-temperature diffraction
Microdiffraction
Polymorphs
Pore size distribution
Powder crystallography
Qualitative analysis
Quantitative analysis
Rietveld analysis
SAXS (industrial)
SAXS (polymers and gels)
Semiconductor metrology
Texture and pole figures
Thin film analysis
X-ray reflectometry
XRD-DSC