High-resolution benchtop microtomography of large samples
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software