Crystal grain conditions dramatically influence observed 2D XRD images, with fine grains appearing as rings and coarse grains as spots. If the intensity distributions along the rings are uniform, the corresponding phase has no preferred orientation. If the intensities appear as broken lines, the corresponding phase has preferred orientation. In the classical approach, XRD software only attempted crystal phase identification after converting a 2D diffraction image to a 1D profile. Information about grain conditions in the 2D diffraction image was not used. The Powder XRD plugin for SmartLab Studio II uses both the 2D diffraction image and the 1D profile derived from it for analysis. Using phase identification results and the 2D diffraction image together, the grain condition and orientation of each phase in a sample can be visually confirmed.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Compact X-ray diffractometer for quality control of materials that is easy to use and is ideal for routine work
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
Windows®-based software suite for Rigaku's X-ray diffractometers