A Cu target is widely used for X-ray diffraction measurements because it efficiently generates X-rays due to its excellent thermal conductivity and is inexpensive. Additionally, the wavelength of the characteristic line Kα1 allows observation up to a d-value of 0.82 Å (2θ = 140 ̊), so it is suitable for determining crystal structures at atomic position level. Despite these advantages, diffraction profiles for Fe compounds exhibit high backgrounds due to fluorescent X-rays generated by Fe, which makes it difficult to distinguish low-intensity diffraction peaks from the background. Here, we illustrate diffraction results with low background and a high P/B ratio obtained using the X-ray fluorescence reduction mode of a 2D detector with a Cu source.
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
High-performance, multi-purpose XRD system for applications ranging from R&D to quality control
Windows®-based software suite for Rigaku's X-ray diffractometers
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
2D X-ray detector with latest semiconductor technology designed for home lab diffractometers