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Material characterization by PDF and RDF analysis

AppNote B-XRD1107: Material characterization by PDF and RDF analysis

Background

Pair Distribution Function (PDF) and Radial Distribution Function (RDF) analyses can derive atomic distances and atomic coordinates from an X-ray diffuse scattering pattern regardless of the crystallinity of the materials. Therefore, it is possible to perform the analysis for amorphous materials and nanomaterials that present broad peaks called halos.

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