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Evaluation of temperature dependence of lattice constant using IR high-temp attachment

AppNote B-XRD1011: temperature dependence of a lattice constant

Background

Using X-ray diffraction, it is possible to identify crystal phases based on the crystalline structure of a material, and evaluate factors such as lattice length, and atom coordinate positions. Therefore, X-ray diffractometry is an analytic technique, which is essential for research on the properties of materials. Within diffractometry, X-ray diffraction measurement under high temperatures is a powerful technique, which goes beyond the identification of material structure and properties that are achieved with ordinary measurement. It enables examination of phase transitions and chemical reactions, which occur under high temperatures, deterioration conditions and synthesis processes, and temperature dependence of lattice constants.