Sample preparation methods for X-ray fluorescence analysis (XRF) featuring powder samples were discussed in the previous issues. Preparation of metal samples is introduced in this issue. XRF is superior to ICP and optical emission spectroscopy in reproducibility. However most of analysis errors in XRF can be caused by nature of sample itself and sample preparation, as in the case of powder samples discussed before. Analysis errors of metal samples come from (1) internal segregation, (2) defective surface, (3) surface roughness and uneven surface, (4) surface transformation, (5) metallurgical history, etc. Consideration of these points will provide more accurate analysis results.
Takao Moriyama and Eiichi Furusawa