High-throughput, high-resolution X-ray topography imaging system: XRTmicron
The XRTmicron is a topography measurement system which can reduce measurement time by one order of magnitude compared to previous systems by using a new...
The XRTmicron is a topography measurement system which can reduce measurement time by one order of magnitude compared to previous systems by using a new...
X-ray topography is a powerful technique for evaluating crystal defects such as dislocations, stacking faults, scratches, and so on. High–performance electronics devices such as microprocessors...
The modern X-ray diffractometer has drastically changed in performance compared with those from even only 10 years ago. With Hybrid Photon Counting (HPC) detector technology...
For more than 50 years, X-ray topography (XRT) has been an indispensable industrial and research tool for crystal growth of functional materials, since crystalline defects...
One of the major technical challenges of this decade are energy efficient technologies, which is among others, comparable in its importance to Artificial Intelligence, 5G...
Abstract
Rigaku launched a high-speed X-ray topography system with the improved throughput of 10–20 wafers/hour (3–6 min/wafer). High-speed image acquisition is achieved using an uncollimated...
Among the various analysis techniques, single crystal X-ray structure analysis can be regarded as the most effective analysis technique for acquiring knowledge about the 3-dimensional...
I would like to take this opportunity to address the recent acquisition of Agilent’s XRD business by Rigaku Corporation and the subsequent creation of a...