Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
Process XRR, XRF, and XRD metrology tool for blanket and patterned wafers; up to 300 mm wafers
This versatile X-ray metrology tool enables high-throughput measurements on blanket wafers ranging from ultra-thin single-layer films to multilayer stacks for process development and film quality control.
In TG-FTIR, gases evolved by volatilization or thermal decomposition are qualitatively analyzed, which allows you to track changes in the generated amount along with the temperature change.
Calibrated metrology pA meter for intensity measurement