High-resolution benchtop microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
Laboratory micro-spot XRD residual stress analysis with both iso- and side-inclination methods
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Special CMF optic designed for SAXS instrumentation