A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
60 kV EDXRF system featuring QuantEZ software and optional standardless analysis
EDXRF spectrometer with powerful Windows® software and optional FP.
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin films