A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)
Scanning multi-element process coatings analyzers for web or coil applications
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
60 kV EDXRF system featuring QuantEZ software and optional standardless analysis