High-resolution benchtop microtomography of large samples
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
Handheld Raman for raw material identification and finished product authentication using 1064 nm Raman analysis.
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry