High-performance, Cartesian-geometry EDXRF elemental analyzers for measuringes Na to U in solids, liquids, powders and thin films
300 kV microcomputerized directional industrial X-ray system
Small, light weight non-destructive testing X-ray generator
250 kV microcomputerized directional industrial X-ray system
Foreign object X-ray inspection instrument
Foreign object X-ray inspection instrument
High-resolution benchtop microtomography of large samples
A cost-effective solution for departments looking for targeted chemical threat analysis
Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples