Dr. Satoshi Omura of Kitasato Univerisity and his collaborator, Dr. William C. Campbell of Merck, were awarded the 2015 Nobel Prize in Physiology or Medicine “for their discoveries concerning a novel therapy against infections caused by roundworm parasites”. What they discovered is the breakthrough medicine ivermectin which cures onchocerciasis, an...
X-ray diffraction is an analytical method for the characterization of the crystalline structure of a material, where the X-ray intensity (I) variation is recorded as a function of diffraction angle (2θ). The diffraction region where 2θ≦10° is called the Small Angle X-ray Scattering (SAXS) area, and the area where 2θ≧5°...
The previous series have discussed single crystal X-ray analysis of small molecules. This series will discuss structure analysis of proteins using X-ray diffraction. The explanation will focus in particular on differences between structure analysis of proteins and that of small molecules.
In structure analysis of proteins or small molecules, the...
The general preparation method of fusion bead, equipment, reagents and other important considerations were described in the previous article “Sample preparation for X-ray fluorescence analysis IV Fusion bead method—part 1 basic principles.” In this article, the preparation methods of various applications such as ferroalloy, sulfide and carbide are described.
Quality control is a top priority for the pharmaceutical industry. RMID (raw material identification) is an important part of quality control. Since health authorities of many countries including Japan joined PIC/S recently, quick and reliable RMID is becoming more important.
In the field of RMID, IR (infrared) and NIR (near...
X-ray fluorescence spectrometry is one of the common instrumental analysis techniques for routine quality control. This is due to high precision and easy sample preparation compared to other instrumental analytical methods. It is also a powerful analytical tool in the field of research and development for the analysis of advanced...
X-ray fluorescence spectrometry (XRF) is well known as an analysis method with high precision by means of non-destructive and no contact analysis, and is therefore widely used for process and quality control at production sites.
In particular, total reflection X-ray fluorescence spectrometry (TXRF) developed in the 1970s is a special...
X-ray topography is a powerful technique for evaluating crystal defects such as dislocations, stacking faults, scratches, and so on. High–performance electronics devices such as microprocessors, solid-state memories, imaging processors are fabricated on dislocation-free Si single crystal wafers. However, device fabrication processes often induce dislocations in the Si wafers that can...
