Our most popular diffractometer for Chemical Crystallography and Mineralogy, configured with either single or dual microfocus sealed tube X-ray sources and an extremely low noise direct X-ray detection detector.
Foreign object X-ray inspection instrument
Foreign object X-ray inspection instrument
Foreign object X-ray inspection instrument
200 kV microcomputerized directional industrial X-ray system
High-speed, stationary sample microtomography of large samples
300 kV microcomputerized directional industrial X-ray system