Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-resolution benchtop microtomography of large samples
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
TG-DTA is a hyphenated technology generally referred to as simultaneous thermal analysis (STA).