Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance
High-resolution benchtop microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)
Scanning multi-element process coatings analyzers for web or coil applications
In-line, simultaneous WDXRF spectrometer for wafer metal film metrology; up to 300 mm wafers
Simultaneous WDXRF spectrometer for wafer metal film metrology; up to 200 mm wafers