High-resolution benchtop microtomography of large samples
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
A fast, high-resolution laboratory X-ray topography system for non-destructive dislocation imaging