High-resolution benchtop microtomography of large samples
Compact 2D X-ray camera with micron and sub-micron resolution for imaging
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
A bespoke, extremely high-flux diffractometer with custom enclosure and the flexibility to utilize both ports of the rotating anode X-ray source.
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
TMA is the measurement of a change in dimension or mechanical property of the sample while it is subjected to a controlled temperature program.
DSC is a thermal analysis technique that quantifies the amount of energy in a reaction.