High-resolution benchtop microtomography of large samples
High-speed, stationary sample microtomography of large samples
Ultra-high resolution nanotomography using parallel beam geometry
A modernized 2D Kratky system that eliminates data corrections required of traditional systems
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
Small and wide angle X-ray scattering instrument designed for nano-structure analyses
New 6th-generation general purpose benchtop XRD system for phase i.d and phase quantification
Highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance