High-resolution benchtop microtomography of large samples
Advanced state-of-the-art high-resolution XRD system powered by Guidance expert system software
High-performance, Cartesian-geometry EDXRF elemental analyzers for measuringes Na to U in solids, liquids, powders and thin films
Ultra-high resolution nanotomography using parallel beam geometry
EDXRF multi-element process analyzer; analyze aluminum (Al) through uranium (U)
Scanning multi-element process coatings analyzers for web or coil applications
Affordable, high-end, tube-above Industrial WDXRF for the analysis of solid samples
Benchtop tube below sequential WDXRF spectrometer analyzes O through U in solids, liquids and powders
High power, tube above, sequential WDXRF spectrometer with new ZSX Guidance expert system software